Investigation of gamma radiation shielding properties of hafnium dioxide thin films prepared at different molarities with using 14.9, 22.1, 32.1, 41.5 and 59.5 keV energies

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dc.contributor.authorKanmaz, I.
dc.contributor.authorKaksal, O. K.
dc.contributor.authorApaydin, G.
dc.contributor.authorTomakin, M.
dc.contributor.authorCengiz, E.
dc.date.accessioned2026-01-24T12:31:07Z
dc.date.available2026-01-24T12:31:07Z
dc.date.issued2026
dc.departmentAlanya Alaaddin Keykubat Üniversitesi
dc.description.abstractEffective shielding against gamma radiation is essential in sensitive domains such as microelectronics, aerospace technology, and radiation detection systems. In this regard, thin-film technologies are considered to provide effective and appropriate protection in microscale systems to alleviate the detrimental effects of gamma radiation. This study investigates the fabrication of HfO2 thin films at five distinct molarities via a spin-coating technique, a modification of the sol-gel method. The radiation shielding parameters, such as linear attenuation coefficient (LAC), mass attenuation coefficient (MAC), tenth value layer (TVL), mean free path (MFP), and half value layer (HVL), were thoroughly analysed. This study investigated the effectiveness of different materials in shielding photons emitted from Yttrium K alpha (14.9 keV), Silver K alpha (22.1 keV), Barium K alpha (32.1 keV), Europium K alpha (41.5 keV), and Americium-241 K alpha (59.5 keV) sources. The radiation shielding parameters for the Americium241 radioactive annular gamma source, were meticulously examined using the secondary induced radiation attenuation method, which facilitated the extraction of multiple energies from a singular source while preserving the identical geometry. This experiment employed a photon-counting detection system characterized by a resolution of 150 eV at an energy level of 5.95 keV. The attenuation results of thin hafnium dioxide films with different thickness and molarity ratios were examined in this study demonstrate their potential as effective attenuation materials at suitable thicknesses. The results indicated that increased molarity significantly affected the thickness of thin films, and the attenuation properties improved with higher molarity.
dc.description.sponsorshipTUBITAK - Scientific and Technological Research Council of Turkiye [121C375]
dc.description.sponsorshipThis work was supported by TUBITAK Project No. 121C375, which is funded by the Scientific and Technological Research Council of Turkiye. The relevant institution is thanked by the authors for its assistance.
dc.identifier.doi10.1016/j.apradiso.2025.112274
dc.identifier.issn0969-8043
dc.identifier.issn1872-9800
dc.identifier.pmid41166792
dc.identifier.scopus2-s2.0-105020254293
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1016/j.apradiso.2025.112274
dc.identifier.urihttps://hdl.handle.net/20.500.12868/5641
dc.identifier.volume227
dc.identifier.wosWOS:001608241900001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.indekslendigikaynakPubMed
dc.language.isoen
dc.publisherPergamon-Elsevier Science Ltd
dc.relation.ispartofApplied Radiation and Isotopes
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260121
dc.subjectRadiation protection
dc.subjectAmericium-241 radioactive source
dc.subjectThin film
dc.subjectSecondary target energies
dc.titleInvestigation of gamma radiation shielding properties of hafnium dioxide thin films prepared at different molarities with using 14.9, 22.1, 32.1, 41.5 and 59.5 keV energies
dc.typeArticle

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