Investigation of mass attenuation coefficients ofcopper-silverthin films at 14.93-48.82keVenergy range
[ X ]
Tarih
2020
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Wiley
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
In this study, the mass attenuation coefficients of copper-silver thin-film alloys, produced by the thermal evaporation method at various concentrations, were measured at six different energies in the range of 14.93-48.82 keV (keV) by X-ray Fluorescence technique (XRF). A(241)Americium radioisotope source, having 50 mCi intensity and 59.54 keV energy photons, was used to stimulate the samples, and an Ultra-LEGe detector was used to count the characteristic X-rays emitted from the samples and from the source. At 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients of Cu-Ag thin-film alloys increased with increasing Cu concentration, while decreasing with increasing Cu concentration at 27.37, 32.068, and 48.82 keV energies. However, at 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients decreased with increasing Ag concentration, while increasing with increasing Ag concentration at 27.37, 32.068, and 48.82 keV energies. The obtained results were compared with the values theoretically predicted by XCOM, and the experimental results are in good agreement with theoretical values within the error limits.
Açıklama
Anahtar Kelimeler
Kaynak
X-Ray Spectrometry
WoS Q Değeri
Q3
Scopus Q Değeri
Q3
