Exploring the structural and electronic properties of CeO2 thin films: role of thickness, temperature, and oxygen vacancies

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dc.contributor.authorGünaydın, Selen
dc.contributor.authorCengız, Erhan
dc.contributor.authorKanmaz, İmran
dc.contributor.authorApaydın, Gökhan
dc.contributor.authorMiyazaki, Hidetoshi
dc.contributor.authorHarfouche, M.
dc.contributor.authorÖzkendir, Osman Murat
dc.date.accessioned2026-01-24T12:20:49Z
dc.date.available2026-01-24T12:20:49Z
dc.date.issued2025
dc.departmentAlanya Alaaddin Keykubat Üniversitesi
dc.description.abstractSystematic investigation of the temperature-dependent local arrangements in CeO<inf>2</inf> thin films and their direct impact on electronic properties is presented. Results revealed that thicker films promote oxygen vacancy formation, reducing Ce4+ to Ce3+ and modifying the local coordination. Furthermore, temperature-dependent EXAFS analysis uncovers a local structural rearrangement transition above 400 K, driven by thermal activation of oxygen vacancies. This rearrangement, occurring within a globally stable cubic framework, directly alters the hybridization between Ce 4f/5d and O 2p orbitals. Density Functional Theory (DFT) calculations corroborate the experimental findings, revealing an indirect bandgap of 1.60 eV as a result of orbital hybridization. © 2025, National Institute of Optoelectronics. All rights reserved.
dc.identifier.endpage595
dc.identifier.issn1454-4164
dc.identifier.issue11-12
dc.identifier.scopus2-s2.0-105025798768
dc.identifier.scopusqualityQ4
dc.identifier.startpage587
dc.identifier.urihttps://hdl.handle.net/20.500.12868/4583
dc.identifier.volume27
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherNational Institute of Optoelectronics
dc.relation.ispartofJournal of Optoelectronics and Advanced Materials
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_Scopus_20260121
dc.subjectCerium dioxide (CeO2)
dc.subjectElectronic structure
dc.subjectEXAFS
dc.subjectThin films
dc.titleExploring the structural and electronic properties of CeO2 thin films: role of thickness, temperature, and oxygen vacancies
dc.typeArticle

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