Çümen, HarunHatipoğulları, Merve MeltemAkkuş, TubaPorikli Durdağı, Sevil2021-02-212021-02-2120192667-7814https://dergipark.org.tr/tr/download/article-file/657382https://hdl.handle.net/20.500.12868/1414In this work,EDXRF are used to demonstrate the effect of an applied magnetic field, on thedetermination of energy of X-ray line, full width at half maximum (FWHM),asymmetry index (AI) and intensity ratio values. To this end, various initialmagnetic fields were induced on a selenide compounds, and for each level ofresidual magnetic field, their corresponding K? and K?spectra were collected from a Si(Li) detector. The results showed a strong correlation between the residual samplemagnetic field and the atomic parameters such as energy shifts and asymmetryindices. It was observed that the chemical shift values increases withapplying the sample magnetic field but FWHM values starts decreasing withhigher levels of initial residual magnetic fields. eninfo:eu-repo/semantics/openAccessEDXRFExternal Magnetic FieldIntensity RatioEDXRFExternal Magnetic FieldIntensity RatioAnalysis of magnetic field effects on K? and K? XRF spectra of selenide compoundsArticle1NSP2018 Özel Sayı5258